Research Units

Transmission Electron Microscopy Unit

Transmission electron microscope JEM-2100 produced by «JEOL Ltd.» company (Japan)with STEM-system and energy-dispersive micro(nano)analysis system INCA Energy TEM 350 with crystal X-MAX 80  produced by «OXFORD Instruments Analytical Limited» (Great Britain).

Accelerating voltage: up to 200 kV Resolution: up to 0.19 nm Magnification: up to 500 000 x1 Defining elements: from Be to Pu Energy resolution of the detector: 127 eV.

Studying the structure of materials, identification of crystalline phases using microdiffraction methods, determination of particles and crystals size, qualitative and quantitative elemental micro (nano) analysis in the point sphere, construction of elements profiles along a given line, mapping the distribution of elements on selected area, mapping diagrams of distribution of elements and phase maps.

Researchers:

• Principal Research Engineer, physicist-mathematician Misevra Sergey Yakovlevich, e-mail: SMisevra@ektu.kz
• Research Engineer, doctor of physical and mathematical sciences Alontseva Daria L'vovna, e-mail: DAlontseva@ektu.kz
• Research Engineer, MEng in materials science Dzhes Aleksey Vladimirovich, 
• e-mail: ADzhes@ektu.kz

Sample preparation for TEM

PIPS 691 precision ion polishing system. Preparation of thin films for TEM.	TenuPol-5 automatic electrolytic thinning system. Preparation of thin foils for TEM.

Sample preparation:

• Engineer-lab assistant, MEng in materials science Dzhes Aleksey Vladimirovich, e-mail: ADzhes@ektu.kz

Scanning Electron Microscopy Unit

Scanning electron microscope JSM-6390LV produced by «JEOL Ltd.» company (Japan) with INCA Energy Penta FET X3 system of energy-dispersive microanalysis produced by «OXFORD Instruments Analytical Limited» company (Great Britain).

Accelerating voltage: up to 30 kV Resolution: up to 3 nm Magnification: up to х300 000 Defining elements: from B to U Energy resolution of the detector: 137 eV

Study of topography and microstructure of samples and specimens surface (including dielectrics - in low vacuum mode), qualitative and quantitative elemental micro (nano) analysis in the point sphere, construction of elements profiles along a given line, mapping the distribution of elements on a selected area.

Researchers:

• Research Engineer, Master of Physics Sadibekov Aidar Bekadilovich, e-mail: ASadibekov@ektu.kz
• Research Engineer, PhD in Physics Rusakova Alena Viktorovna, ARussakova@ektu.kz e-mail: ARussakova@gmail.com

Sample preparation for SEM:

	High precision cutting machine Minitom produced by «Struers» company. Precision cutting of metal, ceramic and mineralogical specimens for investigation by scanning electron and optical microscopy.
	Grinding and polishing machine LaboPol-5 with a device for automatic grinding and polishing of samples LaboForce-3 manufactured by «Struers» (Denmark). Grinding and polishing of metal, ceramic and mineralogical specimens for investigation by scanning electron and optical microscopy.

Sample preparation:

• Engineer-lab assistant, MEng in materials science Sagidugumar Amangeldi.

X-Ray Diffractometry Unit

X’Pert PRO X-ray diffractometer produced by  «PANalitical» company (the Netherlands).

Measuring range of diffraction angles 2θ: from -12 º to +140 º Minimum scanning step: 0,001º

Qualitative, semiquantitative phase analysis, determination of the cell parameters and crystals orientation, the analysis of polycrystalline structures, microstress and textures.

Researchers:

• Research Engineer, PhD in Physics , Prokhorenkova Nadezhda Valerievna, e-mail: NProkhorenkova@ektu.kz.

Mass-Spectrometry and Atomic-Emission Spectrometry Unit

ICP-MS Agilent 7500cx inductively coupled plasma mass spectrometer produced by «Agilent Technologies» company (the USA).

The minimum detectable concentration of the elements in liquid objects: to 10-9 g/dm3 in solids: up to 1 ppb

Quantitative elemental analysis of inorganic substances and materials (inorganic liquids, water, rocks, ores, metals, ceramics, etc.), isotope analysis.

Agilent 4100 microwave plasma atomic emission spectrometer production of «Agilent Technologies» company (the USA).

The minimum detectable concentration of the elements  in liquid objects:to 10-7 g/dm3 in solids:up to 0,1 ppm

Quantitative elemental analysis of inorganic substances and materials.

Researcher:

• Research Engineer, Master of Chemistry Polezhayev Stanislav Nikolayevich, e-mail: SPolezhaev@ektu.kz

Sample preparation for mass spectrometry and atomic emission spectrometer:

Microwave Oven for specimen deterioration Multiwave 3000 produced by «Anton Paar» company (Austria).   The acid deterioration of powder samples for mass spectrometry and atomic emission spectrometry.

Sample preparation:

• Assistant, bachelor in metallurgy Zabavskaya Anzhela Vladimirovna

X-Ray Fluorescence Spectrometry, Spectrophotometry and Colorimetry Unit

The range of measured energies: from 2 to 30 keV Measurement  range of mass content: from 0,1% to 100% Energy resolution of the detector: less 180 eV

Qualitative and quantitative determination of the content (mass fraction) of the chemical elements in solid, liquid and powder samples, rapid analysis of mineralogical, biophysical, biological, environmental objects.

Spectrophotometer «UNICO-1201» produced by «UNICO» (USA).
	The spectral wavelength range: 325-1000 nm Bandwidth: 5 nm Wavelength setting accuracy, no more than: 2 nm Wavelength setting repeatability: 1nm Scattered light (radiant energy interference): 0.5% T at 340 and 400 nm Photometric range: transmission coefficient (T) from 0 to 125%, optical density (A) 0 to 3.0 Concentration range: from 0 to 1999 C Transmission coefficient determination error, no more than: 1.0% T Working length of cuvettes: 5-10-20-30-40-50 mm
Measurement of a transmission coefficients, an optical density and concentration of solutions. Portable colorimeter DR 890 (HACH 2129) produced by «United Products & Instruments, Inc.» (USA).
	The wavelength, nm: 420, 520, 560, 610 Wavelength accuracy: ± 1 nm Measurement modes: transmission, absorption, concentration Photometric range, A: 0-2 Photometric reproducibility at 1 A, A: ± 0,005 Photometric linearity at 0-1 A, A: ± 0,002 Light scattering,% T at 400 nm: <1
Measurement of ions of the elements and organic substances in solution.
"Alfarad plus" measuring complex for radon, thoron and their fission products monitoring, produced by "NTM-Zaschita" company (Russia).
	Equivalent volume activity measurement unit: Measuring range of radon: from 1 to 1*106 Bq/m3 Measuring range of Thoron: from 0.5 to 1*104 Bq/m3 Volume activity measurement unit: Measuring range of radon-222 in the air: from 1 to 2*106 Bq/m3 Measuring range of 216 Po (ThA): from 1*10-3 to 1*102 pulses/sec Measuring range of radon-222 in water samples: from 6 to 800 Bq/l Measuring range of radon density and flux from soil surface: from 20 to 103 mBq/s*m2 Measuring range of radon-222 with a pre-selection of air samples in samplers: from 20 to 107 Bq/m3 Measuring range of radon-222 in soil air samples: from 103 to 106 Bq/m3

Researcher:

• Research Engineer of the second category, Master of Chemistry Polezhayev Stanislav Nikolayevich, e-mail: SPolezhaev@ektu.kz

Weighing Unit

Electronic analytical scales AUM210-I production of  «Abbota Corporation» company (USA).	Laboratory scales VLTE-1100 production of  LLL "Gosmetr" (Russia).
Weighing of samples of up to 210 g up to 0.1 mg.	Weighing of samples and specimens up to 1100 g within the accuracy 0.01g.

Weighing:

• Assistant, bachelor in metallurgy Zabavskaya Anzhela Vladimirovna