Transmission Electron Microscopy Sector

Transmission electron microscope JEM-2100 manufactured by «JEOL Ltd». (Japan) with STEM-system and energy dispersive micro(nano) system INCA Energy TEM 350 analysis with an X-MAX 80 crystal from «OXFORD Instruments Analytical Limited» (Great Britain).

• Accelerating voltage: up to 200 kV
• Resolution: up to 0.19 nm
• Instrument magnification: up to ×1 500 000
• Defined elements: from Be to Pu
• Energy resolution of the detector: 127 eV

Study of the structure of materials, identification of crystal phases by microdifraction methods, determination of the size of particles and crystals, qualitative and quantitative elemental micro (nano)analysis in a point area, construction of profiles of the distribution of elements along a given line, construction of maps and images of the distribution of elements in a selected area, construction of element scattering diagrams and phase maps.