X-ray diffractometry Sector

X-ray diffractometer X'Pert PRO manufactured by the company "PANalitical" (Netherlands).

• Measuring range of diffraction angles 2θ: from -12º to +140º
• Minimum scanning step: 0,001º

Qualitative, semi-quantitative phase analysis, determination of cell parameters and crystal orientation, analysis of polycrystal structures, microstresses and textures.